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Best NanoTech · Osaka, Osaka, Japan

Senior Test Engineer (ATE – NI STS / Advantest V93K) Japan

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Senior Test Engineer (ATE NI STS / Advantest V93K) Japan

- Location: Japan

- Work Mode: On-site

- Experience Range: 3 7 Years

1. Role Overview

We are looking for a Senior Test Engineer with hands-on experience in ATE platforms (NI STS / Advantest V93K) to support silicon validation and production test development. The role involves end-to-end test program development, characterization, and debugging across wafer sort and final test stages. The candidate will work closely with Product Engineering, Foundry, and Reliability teams during NPI and volume phases. 3. Required Qualifications 4. Technical Skills

- Key Responsibilities

- Develop ATE test programs from scratch for wafer sort and final test environments

- Integrate multiple test functions into optimized test flows for NPI silicon bring-up

- Drive end-to-end test engineering activities with Product, Test, Reliability, and Foundry teams

- Develop and debug test interface hardware schematics

- Analyze wafer sort (WS) and final test (FT) data to define screening specifications

- Develop, debug, and optimize test patterns and test flows

- Perform silicon characterization and debug for new designs and process nodes

- Support product reliability studies including HTOL testing

- Evaluate performance and power characteristics over product lifecycle

- Identify yield issues and support yield improvement activities

- Collaborate across cross-functional teams for issue resolution and product qualification

- Document test methodologies, characterization reports, and debug findings

- Bachelor s or Master s degree in Electronics, Electrical Engineering, or related field

- 3 5 years of experience in semiconductor test engineering (ATE environment)

- Experience in wafer sort and final test for semiconductor devices

ATE Platforms

- NI STS (Semiconductor Test System)

- Advantest V93K

Programming & Scripting

- C / C++

Device & Domain Expertise

- Memory (Digital / Analog)

- Mixed-Signal Devices

- Power Management ICs

Test & Validation

- Wafer Sort (WS) and Final Test (FT)

- Silicon Characterization & Debug

- Test Flow Development & Optimization

Hardware & Debug

- Test Interface Hardware (TIH) schematic understanding

- Debug of test hardware and test setups

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